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Insights into the yield enhancement and ion emission process in metal-assisted SIMS

Bibliographic reference Nittler, L. ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, H.-N.. Insights into the yield enhancement and ion emission process in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 45, no.1, p. 18-21 (2013)
Permanent URL http://hdl.handle.net/2078.1/125248
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