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On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties

Bibliographic reference Vayrette, Renaud ; Coulombier, Michaël ; Bhaskar, Umesh Kumar ; Raskin, Jean-Pierre ; Pardoen, Thomas. On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties.Journées de la Matière Condensée - JMC13 (Montpellier, France, du 27/08/2012 au 31/08/2012). In: Proceedings des Journées de la Matière Condensée - JMC13, 2012, p. 479
Permanent URL http://hdl.handle.net/2078/123688