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Deformation mechanisms in aluminium and aluminium-silicon freestanding thin films uncovered through on-chip testing

Bibliographic reference Coulombier, Michaël ; Ryelandt, Laurence ; Idrissi, Hosni ; Wang, Bingyu ; Schrijvers, D. ; et. al. Deformation mechanisms in aluminium and aluminium-silicon freestanding thin films uncovered through on-chip testing.European Congress on Advanced Materials and Processes – EuroMAT 2011 (Montpellier, France, du 12/09/2011 au 15/09/2011). In: Proceedings of the European Congress on Advanced Materials and Processes – EuroMAT 2011, 2011, p. Session In-situ Testing 2, paper # 5
Permanent URL http://hdl.handle.net/2078/123516