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RF behavior of strained Fully Depleted SOI MOSFETs

Bibliographic reference Houri, Samer ; Emam, Mostafa ; Raskin, Jean-Pierre. RF behavior of strained Fully Depleted SOI MOSFETs.Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08 (Cork, Ireland, du 23/01/2008 au 25/01/2008). In: Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’08, 2008, p.pp. 55-56
Permanent URL http://hdl.handle.net/2078.1/123417