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The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs

Bibliographic reference Simoen, E. ; Claeys, C. ; Chung, Tsung Ming ; Flandre, Denis ; Raskin, Jean-Pierre. The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs.22nd Symposium on Microelectronics Technology and Devices - SBMicro'2007 (Rio de Janeiro, Brazil, du 03/09/2007 au 06/09/2007). In: Proceedings of the 22nd Symposium on Microelectronics Technology and Devices - SBMicro'2007, 2007, p.Session “Characterization and Modeling III”, paper # 2
Permanent URL http://hdl.handle.net/2078.1/123298