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On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices
Primary tabs
| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
|---|---|
| Publication date | 2006 |
| Language | Anglais |
| Conference | "Microwave Technology and Techniques Workshop Enabling Future Space Systems", Noordwijk, The Netherlands (du 15/05/2006 au 16/05/2006) |
| Peer reviewed | yes |
| Host document | "Proceedings of the Microwave Technology and Techniques Workshop Enabling Future Space Systems"- p. 6 pages (paper 30) |
| Publication status | Publié |
| Affiliation | UCL - FSA/ELEC - Département d'électricité |
| Links |
| Bibliographic reference | Raskin, Jean-Pierre ; Pailloncy, G. ; Lederer, Dimitri. On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices.Microwave Technology and Techniques Workshop Enabling Future Space Systems (Noordwijk, The Netherlands, du 15/05/2006 au 16/05/2006). In: Proceedings of the Microwave Technology and Techniques Workshop Enabling Future Space Systems, 2006, p. 6 pages (paper 30) |
|---|---|
| Permanent URL | http://hdl.handle.net/2078.1/123233 |