User menu

On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices

Bibliographic reference Raskin, Jean-Pierre ; Pailloncy, G. ; Lederer, Dimitri. On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices.Microwave Technology and Techniques Workshop Enabling Future Space Systems (Noordwijk, The Netherlands, du 15/05/2006 au 16/05/2006). In: Proceedings of the Microwave Technology and Techniques Workshop Enabling Future Space Systems, 2006, p. 6 pages (paper 30)
Permanent URL http://hdl.handle.net/2078.1/123233