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On-wafer wideband characterization of advanced MOS devices

Bibliographic reference Lederer, Dimitri ; Chung, Tsung Ming ; Pailloncy, G. ; Raskin, Jean-Pierre. On-wafer wideband characterization of advanced MOS devices.Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting (Eindhoven, The Netherlands, 12/05/2006). In: Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting, 2006, p. 17
Permanent URL http://hdl.handle.net/2078.1/123232