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2-D and 3-D wideband simulations of multi-gate SOI MOSFETs

Bibliographic reference Chung, Tsung Ming ; Kranti, A. ; Raskin, Jean-Pierre. 2-D and 3-D wideband simulations of multi-gate SOI MOSFETs.6th European Conference on ULtimate Integration of Silicon - ULIS’05 (Bologna, Italy, du 07/04/2005 au 08/04/2005). In: Proceedings of the 6th European Conference on ULtimate Integration of Silicon - ULIS’05, 2005, p.pp. 83-86
Permanent URL http://hdl.handle.net/2078.1/123199