User menu

Noise modeling and performance of SOI MOSFETs

Bibliographic reference Danneville, F. ; Pailloncy, G. ; Iniguez, B. ; Raskin, Jean-Pierre ; Dambrine, G.. Noise modeling and performance of SOI MOSFETs.IEEE MTT-S International Microwave Symposium – Workshop on high frequency noise in advanced Silicon-based devices: from basics to state-of-the-art device and circuit performances (Fort Worth, Texas, USA, du 06/06/2004 au 11/06/2004). In: Proceedings of the IEEE MTT-S International Microwave Symposium – Workshop on high frequency noise in advanced Silicon-based devices: from basics to state-of-the-art device and circuit performances, 2004, p. Paper WSN2
Permanent URL http://hdl.handle.net/2078.1/122998