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Noise Modeling and Performance in 0.15 µm Fully Depleted SOI MOSFET

Bibliographic reference Pailloncy, G. ; Iniguez, B. ; Dambrine, G. ; Dehan, Morin ; Raskin, Jean-Pierre ; et. al. Noise Modeling and Performance in 0.15 µm Fully Depleted SOI MOSFET.SPIE Second International Symposium on Fluctuations and Noise (Gran Canaria, Spain, du 25/05/2004 au 28/05/2004). In: Proceedings of SPIE vol. 5470, Noise in Devices and Circuits II, 2004, p.pp. 122-130
Permanent URL http://hdl.handle.net/2078.1/122949