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Characterization and modelling of quasi double-gate SOI MOSFETs

Bibliographic reference Chung, Tsung Ming ; Raskin, Jean-Pierre. Characterization and modelling of quasi double-gate SOI MOSFETs.Union Radio-Scientifique Internationale (U.R.S.I.) (Brussels, Belgium, 18/12/2003). In: Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), 2003, p. 39
Permanent URL http://hdl.handle.net/2078.1/122940