User menu

Gate length scaling and microwave performance of double gate nano-transistors

Bibliographic reference Kranti, A. ; Chung, Tsung Ming ; Raskin, Jean-Pierre. Gate length scaling and microwave performance of double gate nano-transistors.International Conference on Nano Science and Technology (ICONSAT 2003) (Kolkata, India, du 17/12/2003 au 20/12/2003). In: Proceedings of the International Conference on Nano Science and Technology (ICONSAT 2003), 2003, p.pp. 88-89
Permanent URL http://hdl.handle.net/2078.1/122935