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Microscopic analysis of high-frequency noise behaviour of Fully-Depleted Silicon-on-Insulator MOSFETs

Bibliographic reference Rengel, R. ; Mateos, José ; Pardo, D. ; Gonzalez, T. ; Martin, M.J. ; et. al. Microscopic analysis of high-frequency noise behaviour of Fully-Depleted Silicon-on-Insulator MOSFETs.17th International Conference on Noise and Fluctuations – ICNF 2003 (Prague, Czech Republic, du 18/08/2003 au 22/08/2003). In: Proceedings of the 17th International Conference on Noise and Fluctuations, ICNF 2003, 2003, p.pp. 585-588
Permanent URL http://hdl.handle.net/2078.1/122729