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Microscopic analysis of high-frequency noise behaviour of Fully-Depleted Silicon-on-Insulator MOSFETs
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| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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| Publication date | 2003 |
| Language | Anglais |
| Conference | "17th International Conference on Noise and Fluctuations – ICNF 2003", Prague, Czech Republic (du 18/08/2003 au 22/08/2003) |
| Peer reviewed | yes |
| Host document | "Proceedings of the 17th International Conference on Noise and Fluctuations, ICNF 2003"- pp. 585-588 |
| Publication status | Publié |
| Affiliation | UCL - FSA/ELEC - Département d'électricité |
| Links |
| Bibliographic reference | Rengel, R. ; Mateos, José ; Pardo, D. ; Gonzalez, T. ; Martin, M.J. ; et. al. Microscopic analysis of high-frequency noise behaviour of Fully-Depleted Silicon-on-Insulator MOSFETs.17th International Conference on Noise and Fluctuations – ICNF 2003 (Prague, Czech Republic, du 18/08/2003 au 22/08/2003). In: Proceedings of the 17th International Conference on Noise and Fluctuations, ICNF 2003, 2003, p.pp. 585-588 |
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| Permanent URL | http://hdl.handle.net/2078.1/122729 |