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High-Frequency noise in FDSOI MOSFETs: a Monte Carlo investigation

Bibliographic reference Rengel, R. ; Mateos, José ; Pardo, D. ; Gonzalez, T. ; Martin, M.J. ; et. al. High-Frequency noise in FDSOI MOSFETs: a Monte Carlo investigation.SPIE's 1st International Symposium on Fluctuations and Noise (Santa Fe, NM, USA, du 01/06/2003 au 04/06/2003). In: edited by M. Jamal Deen, Zeynep Çelik-Butler, Michael A. Levinshtein, Proceedings of SPIE vol. 5113 Noise in Devices and Circuits, 2003, p.pp. 379-386
Permanent URL http://hdl.handle.net/2078.1/122719