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Back-gate Bias Influence on the Operation of Lateral SOI PIN Photodiodes at High Temperatures

Bibliographic reference Novo, Carlo ; Giacomini, Renato ; Doria, Rodrigo ; Afzalian, Aryan ; Flandre, Denis. Back-gate Bias Influence on the Operation of Lateral SOI PIN Photodiodes at High Temperatures.2013 EUROSOI Conference (Paris (France), du 21/01/2013 au 23/01/2013). In: Proceedings of the 2013 EUROSOI Conference, 2013, p. 2 pages
Permanent URL http://hdl.handle.net/2078.1/122648