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Damage growth modeling using the Thick Level Set (TLS) approach: Efficient discretization for quasi-static loadings

Bibliographic reference Bernard, Paul-Emile ; Moës, Nicolas ; Chevaugeon, Nicolas. Damage growth modeling using the Thick Level Set (TLS) approach: Efficient discretization for quasi-static loadings. In: Computer Methods in Applied Mechanics and Engineering, Vol. 233-236, no.1, p. 11-27 (1 August 2012)
Permanent URL http://hdl.handle.net/2078/122582