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Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFET’s

Bibliographic reference Goffioul, Michael ; Dambrine, G. ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFET’s.5th Symposium Diagnostics and Yield, SOI – materials, devices and characterization (Warsaw, Poland, 00/07/2000). In: Proceedings of the 5th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, 2000, p. 8 pages
Permanent URL http://hdl.handle.net/2078.1/122451