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Characterization of SOI MOSFETs at microwave frequencies

Bibliographic reference Gillon, Renaud ; Raskin, Jean-Pierre ; Vanhoenacker-Janvier, Danielle ; Colinge, Jean-Pierre ; Dambrine, G.. Characterization of SOI MOSFETs at microwave frequencies.48th Electrochemical Society Meeting - SOI symposium (Paris, France, 00/09/1997). In: Proceedings of the 48th Electrochemical Society Meeting - SOI symposium, 1997, p.pp. 149-154
Permanent URL http://hdl.handle.net/2078.1/122247