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Direct extraction method of SOI MOSFET transistor's parameters

Bibliographic reference Raskin, Jean-Pierre ; Gillon, Renaud ; Vanhoenacker-Janvier, Danielle ; Colinge, Jean-Pierre. Direct extraction method of SOI MOSFET transistor's parameters.7th International Symposium on SOI Technology and Devices (Los Angeles, USA, du 05/05/1996 au 10/05/1996). In: Proceedings of the 7th International Symposium on SOI Technology and Devices, 1996, p.pp. 225-230
Permanent URL http://hdl.handle.net/2078.1/122232