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Direct extraction method of SOI MOSFET transistor's parameters

Bibliographic reference Raskin, Jean-Pierre ; Gillon, Renaud ; Vanhoenacker-Janvier, Danielle ; Colinge, Jean-Pierre. Direct extraction method of SOI MOSFET transistor's parameters.International Conference on Microelectronic Test Structures, ICMTS 1996. (Trento, Italy, du 26/03/1996 au 28/03/1996). In: Proceedings of the International Conference on Microelectronic Test Structures, ICMTS 1996, 1996, p. 191-194
Permanent URL http://hdl.handle.net/2078.1/122228