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Direct extraction techniques of technological parameters and microwave small-signal model for sub-quarter micron SOI MOSFET’s

Bibliographic reference Goffioul, Michael ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. Direct extraction techniques of technological parameters and microwave small-signal model for sub-quarter micron SOI MOSFET’s. In: Research Journal Telecommunication and Information Technology, Vol. 3, no.4, p. 59-66 (December 2000)
Permanent URL http://hdl.handle.net/2078.1/122013