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Gate length scaling and microwave performance of double gate nanotransistors

Bibliographic reference Kranti, Abhinav ; Chung, Tsung Ming ; Raskin, Jean-Pierre. Gate length scaling and microwave performance of double gate nanotransistors. In: International Journal of Nanoscience, Vol. 4, no.5-6, pp. 1021-1024 (October-December 2005)
Permanent URL http://hdl.handle.net/2078/121821
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