User menu

RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer

Bibliographic reference Ben Ali, Khaled ; Roda Neve, Cesar ; Gharsallah, A ; Raskin, Jean-Pierre. RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer.2012 IEEE International SOI Conference (Napa, CA, USA, du 01/10/2012 au 04/10/2012). In: Proceedings of the SOI Conference (SOI), 2012 IEEE International, 2012, p. 2
Permanent URL http://hdl.handle.net/2078/121766