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Influence of Gate Misalignment on the Electrical Characteristics of MuGFETs

Bibliographic reference Lee, Chi-Woo ; Afzalian, Aryan ; Dehdashti, Nima ; Xiong, Weize ; Colinge, Jean-Pierre. Influence of Gate Misalignment on the Electrical Characteristics of MuGFETs.International Symposium on VLSI Technology – Systems and applications (VLSI-TSA) (Hsinchu (Taiwan), du 27/04/2009 au 29/04/2009). In: Proceedings of the International Symposium on VLSI Technology – Systems and applications (VLSI-TSA), 2009, p. 125-126
Permanent URL http://hdl.handle.net/2078.1/121113