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Study of creep/relaxation mechanisms in thin freestanding nanocrystalline palladium films through the lab-on-chip technology

Bibliographic reference Guisbiers, Grégory ; Colla, Marie-Stéphane ; Coulombier, Michaël ; Raskin, Jean-Pierre ; Pardoen, Thomas. Study of creep/relaxation mechanisms in thin freestanding nanocrystalline palladium films through the lab-on-chip technology. In: Journal of Applied Physics, Vol. 113, no.024513, p. 024513-1 - 024513-6 (2013)
Permanent URL http://hdl.handle.net/2078.1/121110
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