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Extraction of charge trapping parameters in FD SOI MOSFET oxides subjected to gamma-irradiation

Bibliographic reference Houk, Youri ; Nazarov, Alexei ; Turchanikov, V.I. ; Lysenko, V.S. ; Adriaensen, Stéphane ; et. al. Extraction of charge trapping parameters in FD SOI MOSFET oxides subjected to gamma-irradiation.First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) (Granada (Spain), du 19/01/2005 au 21/01/2005). In: Proceedings of the First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005), 2005, p.87-88
Permanent URL http://hdl.handle.net/2078.1/114102