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Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.

Bibliographic reference Dague, Etienne ; Delcorte, Arnaud ; Latgé, Jean-Paul ; Dufrêne, Yves. Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 24, no. 7, p. 2955-2959 (2008)
Permanent URL http://hdl.handle.net/2078.1/11267