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Characterization of insulin adsorption in the presence of albumin by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy.

Bibliographic reference Henry, Marie ; Dupont-Gillain, Christine C. ; Bertrand, Patrick. Characterization of insulin adsorption in the presence of albumin by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy.. In: Langmuir : the A C S journal of surfaces and colloids, Vol. 24, no. 2, p. 458-464 (2008)
Permanent URL http://hdl.handle.net/2078.1/11220