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Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.

Bibliographic reference Delcorte, Arnaud ; Yunus, Sami ; Wehbe, Nimer ; Nieuwjaer, Nicolas ; Poleunis, Claude ; et. al. Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.. In: Analytical Chemistry, Vol. 79, no. 10, p. 3673-3689 (2007)
Permanent URL http://hdl.handle.net/2078.1/10922