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Sensitivity to parameter and data variations in dimensionality reduction techniques

Référence bibliographique Garcia Fernandez, Francisco J. ; Verleysen, Michel ; Lee, John Aldo ; Diaz, Ignacio. Sensitivity to parameter and data variations in dimensionality reduction techniques.21st European Symposium on Artificial Neural Networks, Computational Intelligence and Machine Learning (ESANN 2013) (Bruges (Belgium), du 24/04/2013 au 26/04/2013). In: Proceedings of the 21st European Symposium on Artificial Neural Networks, Computational Intelligence and Machine Learning (ESANN 2013), i6doc.com publ. : Louvain-la-Neuve (Belgium)2013, p. 95-100
Permalien http://hdl.handle.net/2078.1/141007