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Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films

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Référence bibliographique Galceran, M. ; Albou, A. ; Renard, K. ; Coulombier, Michaël ; Jacques, Pascal ; et. al. Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films. In: Microscopy and Microanalysis, Vol. 19, no. 3, p. 693-697 (2013)