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1. • Journal article

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   Effect of interfacial SiO2 thickness for low temperature O-2 plasma activated wafer bonding

   Olbrechts, Benoit[UCL] Zhang, XX Bertholet, Y. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2006) Microsystem Technologies : micro and nanosystems - information storage and processing systems — Vol. 12, no. 5, p. 383-390 (2006)
2. • Journal article

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   Low-temperature wafer bonding: A study of void formation and influence on bonding strength

   Zhang, XX Raskin, Jean-Pierre[UCL] (2005) IEEE Journal of Microelectromechanical Systems — Vol. 14, no. 2, p. 368-382 (2005)
3. • Speech

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   Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack

   Yan, Yiyi[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Virtual conference
4. • Journal article

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   Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)
5. • Journal article

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   Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
6. • Journal article

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   Damage evaluation in graphene underlying atomic deposition dielectrics

   Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Poncelet, Olivier[UCL] Louette, Pierre Urea-Begara F. Idrissi, Hosni[UCL] Turner S. Cabossart D. Colomer J.F. Raskin, Jean-Pierre[UCL] (2018) Belvac News - Société Belge de Vacuologie asbl — Vol. 63, no. 3, p. 1-18 (2018)
7. • Journal article

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   Damage evaluation in graphene underlying atomic layer deposition dielectrics

   Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Poncelet, Olivier[UCL] Louette, Pierre[FUNDP] Ureña Begara, Fernando[UCL] Idrissi, Hosni[UCL] Turner, Stuart Cabosart, Damien[UCL] Colomer, Jean-François[FUNDP] Raskin, Jean-Pierre[UCL] Hackens, Benoît[UCL] Francis, Laurent[UCL] (2015) Scientific Reports — Vol. 5, no. 13523, p. 12 (2015)
8. • Speech

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   Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
9. • Journal article

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   Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 4 (2022)
10. • Journal article

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    Low-temperature wafer bonding optimal O-2 plasma surface pretreatment time

    Zhang, XX Raskin, Jean-Pierre[UCL] (2004) Electrochemical and Solid-State Letters — Vol. 7, no. 8, p. G172-G174 (2004)
11. • Journal article

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    Comparison of TiSi2, CoSi2, and NiSi for thin-film silicon-on-insulator applications

    Chen, J.[UCL] Colinge, Jean-Pierre[UCL] Flandre, Denis[UCL] Gillon, R.[UCL] Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (1997) Journal of the Electrochemical Society — Vol. 144, no. 7, p. 2437-2442 (1997)
12. • Journal article

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    Raman and XPS characterization of vanadium oxide thin films with temperature

    Ureña Begara, Fernando[UCL] Crunteanu, Aurelian Raskin, Jean-Pierre[UCL] (2017) Applied Surface Science — Vol. 403, no.1 May 2017, p. 717-727 (May 2017)
13. • Journal article

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    Optical fibre NO2 sensor based on lutetium bisphthalocyanine in a mesoporous silica matrix

    Debliquy, Marc Lahem, Driss Bueno-Martinez, Antonio Caucheteur, Christophe Bouvet, Marcel Recloux, Isaline Raskin, Jean-Pierre[UCL] Olivier, Marie-Georges (2018) Sensors — Vol. 18, no.3, p. 740 (2018)
14. • Speech

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    A 2-mW power consumption low noise amplifier in PD SOI CMOS technology for 2.4 GHz applications

    El Kaamouchi, Majid[UCL] Si Moussa, M. Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (2006) 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems — Long Beach, CA, USA
15. • Journal article

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    Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films

    van der Rest, Astrid[UCL] Idrissi, Hosni[UCL] Henry, Frédéric[UCL] Favache, Audrey[UCL] Schryvers, Dominique Proost, Joris[UCL] Raskin, Jean-Pierre[UCL] Van Overmeere, Quentin[UCL] Pardoen, Thomas[UCL] (2017) Acta Materialia — Vol. 125, p. 27-37 (2017)
16. • Journal article

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    Comparative study of erbium disilicide thin films grown in situ under ultrahigh vacuum or ex situ with a capping layer

    Reckinger, Nicolas[FUCaM] Dutu, Constantin Augustin[UCL] Tang, Xiaohui[UCL] Dubois, E. Yarekha, D.A. Godey, S. Nougaret, Laurianne[UCL] Lacszcz, J. Ratajczak, J. Raskin, Jean-Pierre[UCL] (2012) Thin Solid Films — Vol. 520, no.13, pp. 4501-4505 (April)
17. • Journal article

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    Double Buried Oxide Trap-Rich Substrates for High Frequency Applications

    Nabet, Massinissa[UCL] Rack, Martin[UCL] Yan, Yiyi[UCL] Nguyen, Bich-Yen Raskin, Jean-Pierre[UCL] (2023) IEEE Electron Device Letters — , p. 1-1 (2023)
18. • Journal article

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    Characterization of high-efficiency multi-crystalline silicon in industrial production

    Tang, Xiaohui[UCL] Francis, Laurent[UCL] Gong, Longfei Wang, Fengzhen Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Zhang, Shuai You, Da Wu, Liang Dai, Bing (2013) Solar Energy Materials & Solar Cells — Vol. 117, p. 225-230 (10 June 2013)
19. • Speech

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    Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology

    Yadav, S. Cardinael, Pieter[UCL] Zhao, M. Vondkar, K. Khaled, A. Rodriguez, R. Vermeersch, B. Makovejev, S. Ekoga, E. Pottrain, A. Waldron, N. Raskin, Jean-Pierre[UCL] Parvais, B. Collaert, N. (2020) 2020 IEEE International Electron Devices Meeting (IEDM) — San Francisco, CA, USA
20. • Journal article

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    CVD synthesis of mono- and few-layer graphene using alcohols at low hydrogen concentration and atmospheric pressure

    Campos Delgado, Jessica[UCL] Botello Mendez, Andrés Rafael[UCL] Algara-Siller, Gerardo Hackens, Benoît[UCL] Pardoen, Thomas[UCL] Kaiser, Ute Dresselhaus, Mildred S.[UCL] Charlier, Jean-Christophe[UCL] Raskin, Jean-Pierre[UCL] (2013) Chemical Physics Letters — Vol. 584, p. 142-146 (2013)
21. • Journal article

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    Very low effective Schottky barrier height for erbium disilicide contacts on n-Si through arsenic segregation

    Reckinger, Nicolas[UCL] Poleunis, Claude[UCL] Dubois, Emmanuel Dutu, Constantin Augustin[UCL] Tang, Xiaohui[UCL] Delcorte, Arnaud[UCL] Raskin, Jean-Pierre[UCL] (2011) Applied Physics Letters — Vol. 99, no. 1, p. 012110 (1-3) (16/06/2011)
22. • Journal article

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    Room temperature atomic layer deposition of Al2O3 and replication of butterfly wings for photovoltaic application.

    Tang, Xiaohui[UCL] Francis, Laurent[UCL] Simonis, P.[FUNDP] Haslinger, Michaël[UCL] Delamare, Romain[UCL] Deschaume, Olivier[UCL] Flandre, Denis[UCL] Defrance, Pierre[UCL] Jonas, Alain M.[UCL] Vigneron, Jean-Pol[FUNDP] Raskin, Jean-Pierre[UCL] (2012) Journal of Vacuum Science and Technology. Part A. Vacuum, Surfaces and Films — Vol. 30, no. 1, p. 01A146 (Janvier 2012)
23. • Speech

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    A crack-on-chip fracture mechanics method for freestanding ultra-thin films from brittle to ductile down to 2D materials

    Pardoen, Thomas[UCL] Jaddi, S. Malik, Mohammad Wasil[UCL] Wang, B. Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] (2022) 18th European Mechanics of Materials Conference - EMMC18 — Oxford, UK
24. • Speech

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    Fracture toughness and environmentally assisted subcritical cracking of thin freestanding Al2O3 and SiO2 films

    Jaddi, Sahar[UCL] Coulombier, Michaël[UCL] Idrissi, Hosni[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2020) 17th European Mechanics of Materials Conference (EMMC17) — Madrid (Spain)
25. • Speech

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    Ultra-low-power SOI CMOS pressure sensor based on orthogonal PMOS gauges

    André, Nicolas[UCL] Delhaye, Thibault[UCL] Al Kadi Jazairli, Mohamad[UCL] Olbrechts, Benoit[UCL] Gérard, Pierre[UCL] Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2017) 22nd IMEKO TC4 International Symposum & 20th International Workshop on ADC Modelling and Testing — Iasi (Romania)

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