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1. • Speech

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   DC-40 GHz SPDTs in 22 nm FD-SOI and Back-Gate Impact Study

   Rack, Martin[UCL] Nyssens, Lucas[UCL] Wane, Sidina Bajon, Damienne Raskin, Jean-Pierre[UCL] (2020) 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) — Los Angeles, CA, USA
2. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part I—Static and Dynamic Physics of Carriers and Traps

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4598-4605 (2021)
3. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part II—Parameter Impact on Harmonic Distortion

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4606-4613 (2021)
4. • Speech

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   High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications

   Courte, Quentin[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Cardinael, Pieter[UCL] Raskin, Jean-Pierre[UCL] (2021) European Solid-State Device Research Conference (ESSDERC 2021) — Grenoble, France
5. • Speech

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   Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates

   Cardinael, Pieter[UCL] Yadav, S. Zhao, M. Rack, Martin[UCL] Lederer, Dimitri[UCL] Collaert, N. Parvais, B. Raskin, Jean-Pierre[UCL] (2021) European Solid-State Device Research Conference (ESSDERC 2021) — Grenoble, France
6. • Speech

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   FD-SOI mm-Wave Differential Single-Pole Switches with Ultra-High Isolation

   Rack, Martin[UCL] Nyssens, Lucas[UCL] Wane, Sidina Bajon, Damienne Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
7. • Speech

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   High Resistivity Trap-Rich Substrate for RF MEMS Switches

   Nabet, Massinissa[UCL] Rack, Martin[UCL] Huet, Benjamin[UCL] Tuyaerts, Romain[UCL] Scheen, Gilles[UCL] Raskin, Jean-Pierre[UCL] (2023) 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP) — Valetta, Malta
8. • Speech

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   Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI

   Bendou, Youssef[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] cathelin, Andreia Raskin, Jean-Pierre[UCL] (2023) 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS) — Edinburgh, UK
9. • Journal article

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   Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
10. • Journal article

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    High-Temperature Characterization of Multiple Silicon-Based Substrate for RF-IC Applications

    Courte, Quentin[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Cardinael, Pieter[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Journal of the Electron Devices Society — Vol. 10, no.1, p. 620-626 (2022)
11. • Speech

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    High-Resistivity substrates with PN interface passivation in 22 nm FD-SOI

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) The 2022 International Symposium on VLSI Technology Systems and Applications (VLSI-TSA) — Hsincu, Taiwan
12. • Speech

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    Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) — Caen, France
13. • Speech

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    Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Courte, Quentin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference — Grenoble, France
14. • Speech

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    Impact of substrate resistivity on spiral inductors at mm-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Schwan, C. Zhao, Z. Lehmann, S. Hermann, T. Allibert, F. Aulnette, C. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
15. • Speech

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    22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
16. • Journal article

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    High-resistivity silicon-based substrate using buried PN junctions towards RFSOI applications

    Moulin, M. Rack, Martin[UCL] Fache, T. Chalupa, Z. Plantier, C. Morand, Y. Lacord, J. Allibert, F. Gaillard, F. Lugo, J. Hutin, L. Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 108301 (2022)
17. • Journal article

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    Time Dependence of RF Losses in GaN-on-Si Substrates

    Cardinael, Pieter[UCL] Yadav, Sachin Zhao, Ming Rack, Martin[UCL] Lederer, Dimitri[UCL] Collaert, Nadine Parvais, Bertrand Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 688-691 (2022)
18. • Speech

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    Field-Effect Passivation of Lossy Interfaces in High-Resistivity RF Silicon Substrates

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) — Caen, France
19. • Speech

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    High performance silicon-based substrate using buried PN junctions towards RF applications

    Moulin, Maxime[UCL] Rack, Martin[UCL] Fache, Thibaud Chalupa, Zdenek Plantier, Christophe Morand, Yves Lacord, Joris Allibert, Frédéric Gaillard, Fred Lugo, Jose Hutin, Louis Raskin, Jean-Pierre[UCL] (2021) 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) — Caen, France
20. • Speech

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    Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Vanbrabant, Martin[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
21. • Journal article

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    High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lhemann, S. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 205 (2023)
22. • Speech

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    Nox and buried PN junctions effect on RF performance of High-Resistivity Silicon substrates

    Moulin, Maxime[UCL] Rack, Martin[UCL] Fache, T. Nabet, Massinissa[UCL] Chalupa, Z. Plantier, C. Allibert, F. Lugo, J. Hutin, L. Raskin, Jean-Pierre[UCL] (2022) The 22nd IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’22 — Las Vegas, USA
23. • Journal article

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    Development Of High Resistivity FD-SOI Substrates for mmWave Applications

    Bertrand, Isabelle Flatresse, Philippe Besnard, Guillaume Bethoux, Jean-Marc Chalupa, Zdenek Plantier, Christophe Rack, Martin[UCL] Nabet, Massinissa[UCL] Raskin, Jean-Pierre[UCL] Allibert, Frederic (2022) ECS Transactions — Vol. 108, no.5, p. 31-45 (2022)
24. • Speech

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    PN Junctions Interface Passivation in 22 nm FD- SOI for Low-Loss Passives

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lehmann, S. Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2022) 24th International Microwave and Radar Conference (MIKON) — Gdansk, Poland
25. • Journal article

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    Impact of substrate resistivity on spiral inductors at mm-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Schwan, Christophe Zhao, Zhixing Lehmann, Steffen Hermann, Tom Allibert, Frederic Aulnette, Cécile Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194 (2022)

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