Accès à distance ? S'identifier sur le proxy UCLouvain
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(2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg(Sweden) -
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(2010) 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) — Chalmers Univ Technol, Gothenburg (Sweden) -
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(2010) 18th European Workshop on Materials for Advanced Metallization — Grenoble(France) -
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(2010) Micro-Optics 2010 — Brussels, Belgium -
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(2010) 23rd IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010) — Wanchai, Hong Kong, China -
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(2010) 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2010) — New Orleans, LA, USA -
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(2010) 2010 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2010) — Hammamet, Tunisia -
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(2010) IEEE Transactions on Signal Processing — Vol. 58, no. 4, p. 2327-2338 (2010) -
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(2010) IEEE Transactions on Electron Devices — Vol. 57, no. 5, p. 1188-1191 (2010) -
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(2010) IEEE Transactions on Signal Processing — Vol. 58, no. 6, p. 3173-3179 (2010) -
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(2010) Neurocomputing — Vol. 73, no. 7-9, p. 1199-1209 (2010) -
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(2010) Applied Physics Letters — Vol. 97, no. 4 (2010) -
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(2010) IEEE Electron Device Letters — Vol. 31, no. 6, p. 537-539 (2010) -
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(2010) Journal of Applied Physics — Vol. 108, no. 3 (2010) -
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(2010) IEEE Transactions on Information Theory — Vol. 56, no. 5, p. 2272-2298 (2010) -
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(2010) Neuropsychologia — Vol. 48, no. 9, p. 2620-2629 (2010) -
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(2010) Signal Processing — Vol. 90, no. 12, p. 3308-3312 (2010) -
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(2010) Acta Materialia — Vol. 58, no. 15, p. 4940-4949 (2010) -
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(2010) Scripta Materialia — Vol. 62, no. 10, p. 742-745 (2010) -
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(2010) Small — Vol. 6, no. 5, p. 627-632 (2010) -
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(2010) Chemical Communications — Vol. 46, no. 19, p. 3330-3332 (2010) -
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(2010) Polymer — Vol. 51, no. 1, p. 115-121 (2010) -
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(2010) Applied Physics Letters — Vol. 96, no. 7 (2010) -
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(2010) IEEE Transactions on Circuits and Systems Part 1: Regular Papers — Vol. 57, no. 8, p. 2066-2074 (2010) -
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(2010) IEEE Transactions on Geoscience and Remote Sensing — Vol. 48, no. 10, p. 3686-3697 (2010)