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1. • Journal article

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   Substrate bias effect linked to parasitic series resistance in multiple-gate SOI MOSFETs

   Rudenko, Tamara Kilchytska, Valeria[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexey Flandre, Denis[UCL] (2007) IEEE Electron Device Letters — Vol. 28, no. 9, p. 834-836 (2007)
2. • Journal article

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   A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures

   Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Dessard, Vincent[UCL] (2005) Journal of Applied Physics — Vol. 97, no. 9, p. 9 pages (2005)
3. • Speech

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   Characterization of Carrier Generation in Thin-Film SOI Devices by Reverse Gated-Diode Technique and Its Application at High Temperatures

   Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2004) NATO Advanced Research Workshop - Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment — Kyiv (Ukraine)
4. • BookChapter

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   Modeling and measurements of generation and recombination currents in thin-film SOi gated-diodes

   Rudenko, Tamara Kilchytska, Valeriya (2002) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices —
5. • Journal article

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   Carrier Mobility in Undoped Triple-Gate FinFET Structures and Limitations of Its Description in Terms of Top and Sidewall Channel Mobilities

   Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexey Flandre, Denis[UCL] (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 12, p. 3532-3541 (2008)
6. • Speech

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   Modeling and measurements of generation and recombination currents in thin-film SOI gated-diodes

   Rudenko, Tamara Kilchytska, Valeriya[UCL] (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
7. • Speech

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   High Temperature Characterization of Carrier Generation in SOI MOS Devices Using Gated-Diode Technique

   Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Dessard, Vincent[UCL] (2001) HITEN'2001 - International Conference on High Temperature Electronic — Oslo (Norway)
8. • Speech

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   Properties of SOI MOSFETs obtained on multilayer buried dielectrics

   Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
9. • Speech

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   Effect of ionizing irradiation on the charge buildup in multilayer buried dielectrics of SOI structures

   Barchuk, I.P. Kilchytska, Valeriya[UCL] Lysenko, V.S. Rudenko, Tamara Djurenko, S.V. Rudenko, A.N. Yurchenko, A.P. (1996) 7th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — Los Angeles (USA)
10. • Journal article

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    Reduction of gate-to-channel tunneling current in FinFET structures

    Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexei (2007) Solid-State Electronics — Vol. 51, no. 11-12, p. 1466-1472 (2007)
11. • Speech

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    Physical analysis of the high-temperature subthreshold slope in SOI MOSFETs

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Colinge, Jean-Pierre[UCL] Flandre, Denis[UCL] (2000) 2000 IEEE International SOI Conference — Wakefield, MA (USA)
12. • Speech

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    Modeling and measurements of high-temperature off-state currents in SOI MOSFETs

    Rudenko, Tamara Rudenko, A. Kilchytska, Valeriya[UCL] (1997) 8th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — Paris (France)
13. • Speech

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    A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs

    Rudenko, Tamara Lysenko, V.S Kilchytska, Valeriya Rudenko, A.N. (1998) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
14. • Speech

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    Effective mobility in FinFET structures with HfO2 and SiON gate dielectrics and TaN gate electrode

    Rudenko, Tamara Collaert, N. De Gendt, Stefan Kilchytska, Valeriya[UCL] Jurczak, M. Flandre, Denis[UCL] (2005) INFOS CONFERENCE 2005 — Leuven (Belgium)
15. • Journal article

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    Electrical properties of ZMR SOI structures: characterization techniques and experimental results

    Rudenko, Tamara Lysenko, V.S. Nazarov, Alexei (1994) Mikroelectronika — Vol. 23, no.6, p. 32-38 (1994)
16. • Speech

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    Electrical characterization of FinFETs: Special aspects

    Kilchytska, Valeriya[UCL] Rudenko, Tamara Flandre, Denis[UCL] (2006) 7th Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI Era — Warszawa (Poland)
17. • Journal article

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    Effect of ionizing irradiation on electrical properties of buried multilayer dielectrics of SOI structures, obtained by ZMR technique

    Vovk, Ya.N. Barchuk, I.P. Kilchytska, Valeriya[UCL] Lysenko , V.S. Nazarov, Alexei Rudenko, Tamara (1996) Mikroelectronika — Vol. 25, no.5, p. 346-353 (1996)
18. • Journal article

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    Effective mobility in FinFET structures with HfO2 and SiON gate dielectrics and TaN gate electrode

    Rudenko, Tamara Collaert, Nadine De Gendt, S. Kilchytska, Valeriya[UCL] Jurczak, Malgorzata Flandre, Denis[UCL] (2005) Microelectronic Engineering — Vol. 80, p. 386-389 (17 June 2005)
19. • Journal article

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    New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures

    Ólafsson, Halldor Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2002) Materials Science Forum — Vol. 389-393, p. 1001-1004 (2002)
20. • Journal article

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    A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface

    Ólafsson, Halldór Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2003) Materials Science Forum — Vol. 433-436, p. 547-550 (2003)
21. • BookChapter

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    Characterization of Carrier Generation in Thin-Film SOI Devices By Reverse Gated-Diode Technique and Its Application At High Temperatures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2005) Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004 — [ISBN : 1-4020-3011-8]
22. • Journal article

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    Electrical properties of ZMR SOI structures with multilayer buried dielectrics

    Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) Mikroelectronika — Vol. 23, no.6, p. 32-38 (1994)
23. • Speech

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    Properties of high-temperature off-state currents in SOI MOSFETs derived from the diffusion mechanism

    Rudenko, Tamara Lysenko, V. Kilchytska, Valeriya Rudenko, A. Colinge, Jean-Pierre[UCL] (1999) Third European Conference on High Temperature Electronics (HITEN 1999) — Berlin (Germany)
24. • Speech

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    Experimental Study of the Effective Mobility in Doped- and Undoped-Channel Triple-Gate FinFET Structures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, N. Jurczak, Malgorzata Nazarov, Alexei Flandre, Denis[UCL] (2007) EUROSOI 2007 — Leuven (Belgium)
25. • Speech

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    Specific features of the capacitance and mobility behaviors in finfet structures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, N. De Gendt, S. Rooyackers, R. Jurczak, M. Flandre, Denis[UCL] (2005) 35th European Solid-State Device Research Conference (ESSDERC 2005) — Grenoble (France)

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