Accès à distance ? S'identifier sur le proxy UCLouvain
Displaying 1 - 25 of 30 results.
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(2010) Proceedings of Asiacrypt 2010 — Singapore -
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(2011) IEEE Transactions on Information Theory — Vol. 57, no. 1, p. 559 - 571 (2011) -
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(2010) Proceedings of ACNS 2010 Industrial Track, the 8th International Conference on Applied Cryptography and Network Security — Beijing/China -
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(2010) Proceedings of LatinCrypt 2010, Conference on Cryptology and Information Security in Latin America — Puebla/Mexico -
- Journal article
(2011) IEEE Transactions on Image Processing — Vol. 20, no. 9, p. 2636 - 2649 (September 2011) -
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(2010) Proceedings of Mobilight 2010, the 2nd International Conference on Mobile Lightweight Wireless Systems — Barcelona/Spain -
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(2010) Proceedings of Africacrypt 2010 — Stellenbosch/South Africa -
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(2010) Proceedings of the 31st WIC Symposium on Information Theory in the Benelux — Rotterdan/the Netherlands -
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(2010) Proceedings of ACM CCS 2010, the 17th ACM conference on Computer and Communication Security — Chicago/Illinois/USA -
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(2010) Workshop on fault diagnosis and tolerance in cryptography (FDTC), 2010 — Santa Barbara, California, USA -
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(2010) Proceedings of ICIP 2010 — Hong Kong -
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(2010) ESSCIRC, European Solid-State Circuits Conference — Valencia (Spain) -
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(2010) New Interfaces for Musical Expression (NIME 2010) — Sydney -
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(2010) 3rd International Workshop on Computational Topology in Image Context — Chipiona, Spain -
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(2010) Proceedings of the META 2010 Conference — Cairo, Egypt -
- Journal article
(2010) EURASIP Journal on Image and Video Processing — Vol. 2010, no. 560927, p. 1-2 (November 2010) -
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(2010) Conference on Design and Architectures for Signal and Image Processing (DASIP), 2010 — Edinburgh (Scotland) -
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(2010) Microelectronic Engineering — Vol. 87, no. 10, p. 1872-1878 (October 2010) -
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(2010) 2010 Materials Research Society Fall Meeting - MRS Fall'10 — Boston, MA, USA -
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(2010) SPIE Photonics Europe (Micro Optics) — Brussels, Belgium -
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(2010) Nanomechanical Testing Workshop and Hysitron User Meeting — INM, Saarbrücken, Germany -
- Journal article
(2012) IEEE Sensors Journal — Vol. 12, no.3, p. 699-706 (03/2012)