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    Use of back gate bias to improve the performance of n- and p-type UTBB transistors-based self-cascode structures applied to current mirrors
    Doria, R.T. Trevisoli, R.[UCL] de Souza, Michelly[UCL] Pavanello, Marcelo Antonio[UCL] Flandre, Denis[UCL] (2017) 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) — Burlingame, California (USA )