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    • Journal article
    On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs
    Simoen, Eddy Flandre, Denis[UCL] Claeys, C. Chung, T. M. Raskin, Jean-Pierre[UCL] (2007) IEEE Electron Device Letters — Vol. 28, no. 10, p. 919-921 (2007)