Search

Pages

1. • Journal article

   • 

   Substrate bias effect linked to parasitic series resistance in multiple-gate SOI MOSFETs

   Rudenko, Tamara Kilchytska, Valeria[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexey Flandre, Denis[UCL] (2007) IEEE Electron Device Letters — Vol. 28, no. 9, p. 834-836 (2007)
2. • Journal article

   • 

   A method for threshold voltage extraction in junctionless MOSFETs using the derivative of transconductance-to-current ratio

   Rudenko, Tamara Nazarov, Alexei Barraud, S. Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2020) Solid-State Electronics — Vol. 107723, no.161, p. 26 (2019)
3. • Journal article

   • 

   A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures

   Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Dessard, Vincent[UCL] (2005) Journal of Applied Physics — Vol. 97, no. 9, p. 9 pages (2005)
4. • BookChapter

   • 

   Modeling and measurements of generation and recombination currents in thin-film SOi gated-diodes

   Rudenko, Tamara Kilchytska, Valeriya (2002) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices —
5. • Journal article

   • 

   Carrier Mobility in Undoped Triple-Gate FinFET Structures and Limitations of Its Description in Terms of Top and Sidewall Channel Mobilities

   Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexey Flandre, Denis[UCL] (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 12, p. 3532-3541 (2008)
6. • Journal article

   • 

   A review of special gate coupling effects in long-channel SOI MOSFETs with lightly doped ultra-thin bodies and their compact analytical modeling

   Rudenko, Tamara Nazarov, Alexei Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2015) Solid-State Electronics — Vol. 117, p. 66-76 (28/11/2015)
7. • Journal article

   • 

   Reduction of gate-to-channel tunneling current in FinFET structures

   Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexei (2007) Solid-State Electronics — Vol. 51, no. 11-12, p. 1466-1472 (2007)
8. • Journal article

   • 

   Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs

   Rudenko, Tamara Nazarov, Alexei Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Popov, V. Ilnitsky, M. Lysenko, V. (2013) Semiconductor Physics, Quantum Electronics & Optoelectronics — Vol. 16, no.3, p. 300-309 (30/09/2013)
9. • Journal article

   • 

   Electrical properties of ZMR SOI structures: characterization techniques and experimental results

   Rudenko, Tamara Lysenko, V.S. Nazarov, Alexei (1994) Mikroelectronika — Vol. 23, no.6, p. 32-38 (1994)
10. • Journal article

    • 

    Effect of ionizing irradiation on electrical properties of buried multilayer dielectrics of SOI structures, obtained by ZMR technique

    Vovk, Ya.N. Barchuk, I.P. Kilchytska, Valeriya[UCL] Lysenko , V.S. Nazarov, Alexei Rudenko, Tamara (1996) Mikroelectronika — Vol. 25, no.5, p. 346-353 (1996)
11. • Journal article

    • 

    Effective mobility in FinFET structures with HfO2 and SiON gate dielectrics and TaN gate electrode

    Rudenko, Tamara Collaert, Nadine De Gendt, S. Kilchytska, Valeriya[UCL] Jurczak, Malgorzata Flandre, Denis[UCL] (2005) Microelectronic Engineering — Vol. 80, p. 386-389 (17 June 2005)
12. • Journal article

    • 

    New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures

    Ólafsson, Halldor Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2002) Materials Science Forum — Vol. 389-393, p. 1001-1004 (2002)
13. • Journal article

    • 

    A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface

    Ólafsson, Halldór Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2003) Materials Science Forum — Vol. 433-436, p. 547-550 (2003)
14. • BookChapter

    • 

    Characterization of Carrier Generation in Thin-Film SOI Devices By Reverse Gated-Diode Technique and Its Application At High Temperatures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2005) Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004 — [ISBN : 1-4020-3011-8]
15. • Journal article

    • 

    Electrical properties of ZMR SOI structures with multilayer buried dielectrics

    Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) Mikroelectronika — Vol. 23, no.6, p. 32-38 (1994)
16. • Journal article

    • 

    High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs

    Lysenko, V.S. Nazarov, Alexei Kilchytska, Valeriya[UCL] Rudenko, Tamara Limanov, A.B. Colinge, Jean-Pierre (1998) Semiconductor Physics, Quantum Electronics & Optoelectronics — Vol. 1, no. 1, p. 101-107 (28/10/1998)
17. • Journal article

    • 

    On the high-temperature subthreshold slope of thin-film SOI MOSFETs

    Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Colinge, Jean-Pierre[UCL] Dessard, Vincent[UCL] (2002) IEEE Electron Device Letters — Vol. 23, no. 3, p. 148-150 (March 2002)
18. • BookChapter

    • 

    A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs

    Rudenko, Tamara Lysenko, V.S. Kilchytska, Valeriya Rudenko, A.N. (2000) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices — [ISBN : 978-0-7923-6117-6]
19. • Journal article

    • 

    Determination of film and surface recombination in thin-film SOI devices using gated-diode technique

    Rudenko, Tamara Flandre, Denis[UCL] Rudenko, A Kilchytska, Valeriya Cristoloveanu, Sorin Ernst, T. Colinge, Jean-Pierre Dessard, Vincent[UCL] (2004) Solid-State Electronics — Vol. 48, no. 3, p. 389-399 (2004)
20. • BookChapter

    • 

    Electrical characterization and special properties of FinFET structures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, N. Nazarov, A. Jurczak, Malgorzata Flandre, Denis[UCL] (2007) Nanoscaled Semiconductor-on-Insulator Structures and Devices — [ISBN : 978-1-4020-6378-7]
21. • BookChapter

    • 

    Total dose radiation response of multilayer buried insulators

    Rudenko, A.N. Nazarov, Alexei Lysenko, V.S. Kilchytska, Valeriya Rudenko, Tamara Djurenko, S.V. (2000) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices — [ISBN : 978-0-7923-6117-6]
22. • Journal article

    • 

    Electrical properties of FinFET structures

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, N. Jurczak, M. Nazarov, A.N. Lysenko, V.S. Flandre, Denis[UCL] (2007) PHYSICAL SENSORS AND MICROSYSTEMS TECHNOLOGIES — p. 13-18 (2007)
23. • Journal article

    • 

    Gm/Id Method for Threshold Voltage Extraction Applicable in Advanced MOSFETs with nonlinear behavior above threshold

    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Rudenko, Tamara (2010) IEEE Electron Device Letters — Vol. 31, no.9, p. 930-932 (09/2010)
24. • Journal article

    • 

    On the gm/ID-based approaches for threshold voltage extraction in advanced MOSFETs and their application to ultra-thin body SOI MOSFETs

    Rudenko, Tamara Md Arshad Raskin, Jean-Pierre[UCL] Nazarov, Alexei Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2014) Solid-State Electronics — , no.97, p. 52-58 (10/05/2014)
25. • Journal article

    • 

    Diffusion model for high-temperature off-state current in SOI MOSFETs

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Rudenko, A.N. (1997) Microelectronic Engineering — Vol. 36, no.1, p. 367-370 (01/06/1997)

Pages