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Displaying 1 - 25 of 54 results.

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    • BookChapter
    Some mitigations for unequal data variance in linear regression
    Dupuis, Pascal[UCL] Van Overstraeten, Nancy[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2012) Advanced Mathematical and Computational Tools in Metrology and Testing IX — [ISBN : 978-981-4397-94-0]
    • Speech
    Surface and strain effects on the conductivity of silicon nanowires
    Bhaskar, U. K. Passi, V. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) 2012 Materials Research Society Fall Meeting – MRS Fall’12 — Boston, Massachusetts (USA)
    • Speech
    X-FEM based modelling of complex mixed mode fatigue crack propagation
    Minnebo, H. André, Simon[UCL] Duflot, M. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) VIth European Congress on Computational Methods in Applied Sciences and Engineering-ECCOMAS 2012 — Vienna, Austria
    • Speech
    Surface and stress effects on the electrical conductivity of nano-scale silicon
    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) 2012 MRS Fall Meeting & Exhibit — Boston, Massachusetts, UDA
    • Journal article
    SOI technologies from microelectronics to microsystems - meeting the More than Moore roadmap requirements
    Raskin, Jean-Pierre[UCL] (2012) Electrochemical Society. Transactions — Vol. 49, no.1, p. 15-23 (2012)
    • Journal article
    High-Throughput On-Chip Large Deformation of Silicon Nanoribbons and Nanowires
    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2012) IEEE Journal of Microelectromechanical Systems — Vol. 21, no.4, p. 822-829 (August 2012)
    • Journal article
    Strain in silicon nanowire beams
    Urena, F. Olsen, S.H. Šiller, L. Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) Journal of Applied Physics — Vol. 112, no. 11, p. 114506 (2012)
    • Speech
    RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer
    Ben Ali, Khaled[UCL] Roda Neve, Cesar[UCL] Gharsallah, A[UCL] Raskin, Jean-Pierre[UCL] (2012) 2012 IEEE International SOI Conference — Napa, CA, USA
    • Journal article
    Extended MASTAR modeling of DIBL in UTB and UTBB SOI MOSFETs
    Arshad, M.K.M.[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] Andrieu, Francois Scheiblin, P. Faynot, O. Flandre, Denis[UCL] (2012) IEEE Transactions on Electron Devices — Vol. 59, no. 1 (article n°6085605), p. 247-251 (01/2012)
    • Speech
    Graphene from alcohols
    Campos Delgado, Jessica[UCL] Botello Mendez, Andrés Rafael[UCL] Hackens, Benoît[UCL] Pardoen, Thomas[UCL] Charlier, J.C.[UCL] Raskin, Jean-Pierre[UCL] (2012) Graphene 2012 International Conference — Brussels, Belgium
    • Journal article
    On-chip stress relaxation testing method for freestanding thin film materials
    Coulombier, Michaël[UCL] Guisbiers, Grégory[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2012) Review of Scientific Instruments — Vol. 83, no.10, pp. 105004 - 105004-9 (2012)
    • Journal article
    Effects of Fast Neutrons on the Electromechanical Properties of Materials Used in Microsystems
    Gkotsis, Petros[UCL] Kilchytska, Valeriya[UCL] Fragkiadakis, Charalampos Kirby, Paul B. Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2012) IEEE Journal of Microelectromechanical Systems — Vol. 21, no.6, p. 1471-1483 (Décembre 2012)
    • Speech
    Improvement of high-frequency FinFET performance by fin width engineering
    Makovejev, Sergej[UCL] Olsen, S.H. Md Arshad, K.[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2012) IEEE 2012 International SOI Conference (SOI’12) — Napa (USA)
    • Speech
    The fracture of polycrystalline silicon based MEMS
    Wang, X.[UCL] Becker, G.[UCL] Ling, Wu[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Noels, L. (2012) 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2012 — Lisbon, Portugal
    • Journal article
    On-chip tensile testing of nanoscale silicon free-standing beams
    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Houri, Samer[UCL] Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) Journal of Materials Research — Vol. 27, no. 3, p. 571-579 (Feb. 2012)
    • Journal article
    RF Harmonic Distortion of CPW Lines on HR-Si and Trap-Rich HR-Si Substrates
    Roda Neve, Cesar[UCL] Raskin, Jean-Pierre[UCL] (2012) IEEE Transactions on Electron Devices — Vol. pp, no. Issue 99, pp. 1-9 (10 février 2012)
    • Speech
    Graphene growth by CVD using liquid precursors
    Campos Delgado, Jessica[UCL] Botello Mendez, Andrés Rafael[UCL] Hackens, Benoît[UCL] Charlier, J.-C.[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) American Physical Society – APS, March meeting 2012 - Graphene: Growth, Mechanical Exfoliation, and Properties — Boston, MA, USA
    • Speech
    SOI technologies from microelectronics to microsystems - meeting the More than Moore roadmap requirements
    Raskin, Jean-Pierre[UCL] (2012) IEEE International Conference on Solid-State and Integrated Circuit Technology – ICSICT’12 — Xi'an, China

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