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    • Journal article
    The Influence of Back Gate Bias on the OCTO SOI MOSFET's Response to X-ray Radiation
    N. de S. Fino, Leonardo A. G. Silveira, Marcilei Renaux, Christian[UCL] Flandre, Denis[UCL] Pinillos Gimenez, Salvador (2015) Journal of Integrated Circuits and Systems — Vol. 10, no.1, p. 43-48 (2015)