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1. • Journal article

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   Low-power dihexylquaterthiophene-based thin film transistors for analog applications.

   Serban, Dana Alina[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Vlad, Alexandru[UCL] Martin-Hoyas, Ana[UCL] Nysten, Bernard[UCL] Jonas, Alain M.[UCL] Geerts, Y. H. Lazzaroni, R. Bayot, Vincent[UCL] Melinte, Sorin[UCL] (2008) Applied Physics Letters — Vol. 92, no. 14, p. 143503(3) (2008)
2. • Journal article

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   Characterization and design methodology for low-distortion MOSFET-C analog structure's in multithreshold deep-submicrometer SOICMOS technologies

   Vancaillie, L.[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Alvarado, Joaquin[UCL] Cerdeira, A. (2006) IEEE Transactions on Electron Devices — Vol. 53, no. 2, p. 263-269 (2006)
3. • Speech

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   In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation

   Amor, Sedki[UCL] Kilchytska, Valeriya[UCL] Tounsi, Fares[UCL] André, Nicolas[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2021) 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) — Caen, France
4. • Journal article

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   Experimental results on diodes and BIMOS ESD devices in 28 nm FD-SOI under TLP & TID radiation

   Galy, Philippe Soto, F. Bourgeat, J. Jacquier, B. Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2020) Microelectronics Reliability — Vol. 114, p. 113938 (2020)
5. • Journal article

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   A method for threshold voltage extraction in junctionless MOSFETs using the derivative of transconductance-to-current ratio

   Rudenko, Tamara Nazarov, Alexei Barraud, S. Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2020) Solid-State Electronics — Vol. 107723, no.161, p. 26 (2019)
6. • Journal article

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   Trap Recovery by in-Situ Annealing in Fully-Depleted MOSFET With Active Silicide Resistor

   Amor, Sedki[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Galy, Philippe (2021) IEEE Electron Device Letters — Vol. 42, no.7, p. 1085-1088 (2021)
7. • Journal article

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   A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures

   Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Dessard, Vincent[UCL] (2005) Journal of Applied Physics — Vol. 97, no. 9, p. 9 pages (2005)
8. • Speech

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   Compact Model for Single Event Transients and Total Dose Eects at High Temperatures for Partially Depleted SOI MOSFETs

   Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta
9. • Speech

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   Characterization of Carrier Generation in Thin-Film SOI Devices by Reverse Gated-Diode Technique and Its Application at High Temperatures

   Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2004) NATO Advanced Research Workshop - Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment — Kyiv (Ukraine)
10. • Journal article

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    Effect of high-energy neutrons on MuGFETs

    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Collaert, N. Rooyakers, R. Militaru, Otilia[UCL] Berger, G.[UCL] Flandre, Denis[UCL] (2010) Solid-State Electronics — Vol. 54, p. 196-204 (2009)
11. • Journal article

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    Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

    Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
12. • Speech

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    RF Plasma Annealing of Positive Charge Created by Fowler-Nordheim Electron Injection in the Buried Oxide of SIMOX SOI structures

    Kilchytska, Valeriya Nazarov, Alexei Barchuk, I. Tkachenko, A. Ashok, D. Ballutaud, D. (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
13. • BookChapter

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    Modeling and measurements of generation and recombination currents in thin-film SOi gated-diodes

    Rudenko, Tamara Kilchytska, Valeriya (2002) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices —
14. • Journal article

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    Carrier Mobility in Undoped Triple-Gate FinFET Structures and Limitations of Its Description in Terms of Top and Sidewall Channel Mobilities

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, Nadine Jurczak, Malgorzata Nazarov, Alexey Flandre, Denis[UCL] (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 12, p. 3532-3541 (2008)
15. • Book

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    Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting

    Nazarov, Alexei Balestra, Francis Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2014)
16. • Speech

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    Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits

    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) EUROSOI 2010 — Grenoble (France)
17. • Speech

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    C-V and thermally activated investigations of ZMR SOI meza structures

    Nazarov, Alexei Lysenko, V.S. Gusev, V.A. Kilchytska, Valeriya[UCL] (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
18. • Speech

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    Modeling and measurements of generation and recombination currents in thin-film SOI gated-diodes

    Rudenko, Tamara Kilchytska, Valeriya[UCL] (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
19. • Journal article

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    Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
20. • Journal article

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    Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
21. • Speech

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    Experimental study of thermal coupling effects in FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
22. • Speech

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    Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) — Caen, France
23. • Speech

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    22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
24. • Journal article

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    Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 704-707 (2022)
25. • Speech

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    Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy

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