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Displaying 11 results.
    • Speech
    Compact Model for Single Event Transients and Total Dose Eects at High Temperatures for Partially Depleted SOI MOSFETs
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta
    • Speech
    Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) EUROSOI 2010 — Grenoble (France)
    • Journal article
    Ultra-low Power High Temperature and Radiation Hard Complementary Metal-Oxide-Semiconductor (CMOS) Silicon-on-Insulator (SOI) Voltage Reference
    Boufouss, El Hafed[UCL] Francis, Laurent[UCL] Kilchytska, Valeriya[UCL] Gérard, Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] (2013) Sensors — Vol. 13, no. 12, p. 17265-17280 (13/12/2013)
    • Speech
    A Compact Model for Single Event Effects in PD SOI sub-micron MOSFETs
    Alvarado, Jose Joaquin[UCL] Boufouss, El Hafed[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2011) Conference on Radiation Effetcs on Components and Systems (RADECS) — Séville (Espagne)
    • Journal article
    Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs
    Alvarado, Joaquin[UCL] Flandre, Denis[UCL] Boufouss, El Hafed[UCL] Kilchytska, Valeriya[UCL] (2010) Microelectronics Reliability — Vol. 50, no. 9-11, p. 1852-1856 (2010)
    • Journal article
    Characterization and modelling of single event transients in LDMOS-SOI FETs
    Alvarado, Jose Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2011) Microelectronics Reliability — Vol. 51, no. 9-11, p. 2004–2009 (Septembre–Novembre 2011)
    • Speech
    Characterization and modeling of single event transients in LDMOS-SOI FETs
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2011) 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis — Bordeaux
    • Journal article
    A compact model for single event effects in PD SOI sub-micron MOSFETs
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Soto-Cruz, B.S.[UCL] Flandre, Denis[UCL] (2012) IEEE Transactions on Nuclear Science — Vol. 59, no. 4, p. 943-949 (14/08/2012)
    • Speech
    Analog design in SOI for hostile environments and high temperatures
    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Alvarado Pulido, José Joaquin[UCL] (2014) EAMTA/CAMTA 2014 — Mendoza (Argentina)
    • Speech
    Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits
    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Boufouss, El Hafed[UCL] Assaad, Maher[UCL] Rue, Bertrand[UCL] Roda Neve, Cesar[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2011) 2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011) — Ghent (Belgium)
    • Speech
    Harsh-environment behaviours and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits
    Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Alvarado, José Joaquin[UCL] Boufouss, El Hafed[UCL] Rue, Bertrand[UCL] Roda Neve, Cesar[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2012) VII Workshop on Semiconductor and Micro & Nano Technology, SEMINATEC 2012 — Sao Bernardo do Campo (Brazil)