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1. • Speech

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   RF Plasma Annealing of Positive Charge Created by Fowler-Nordheim Electron Injection in the Buried Oxide of SIMOX SOI structures

   Kilchytska, Valeriya Nazarov, Alexei Barchuk, I. Tkachenko, A. Ashok, D. Ballutaud, D. (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
2. • BookChapter

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   Modeling and measurements of generation and recombination currents in thin-film SOi gated-diodes

   Rudenko, Tamara Kilchytska, Valeriya (2002) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices —
3. • Speech

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   C-V and thermally activated investigations of ZMR SOI meza structures

   Nazarov, Alexei Lysenko, V.S. Gusev, V.A. Kilchytska, Valeriya[UCL] (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
4. • Speech

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   Modeling and measurements of generation and recombination currents in thin-film SOI gated-diodes

   Rudenko, Tamara Kilchytska, Valeriya[UCL] (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
5. • Journal article

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   Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
6. • Journal article

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   Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
7. • Speech

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   Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) — Caen, France
8. • Speech

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   22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
9. • Journal article

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   Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET

   Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 704-707 (2022)
10. • Speech

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    Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Vanbrabant, Martin[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
11. • Speech

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    Properties of SOI MOSFETs obtained on multilayer buried dielectrics

    Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
12. • Speech

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    Effect of ionizing irradiation on the charge buildup in multilayer buried dielectrics of SOI structures

    Barchuk, I.P. Kilchytska, Valeriya[UCL] Lysenko, V.S. Rudenko, Tamara Djurenko, S.V. Rudenko, A.N. Yurchenko, A.P. (1996) 7th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — Los Angeles (USA)
13. • Journal article

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    On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 665-668 (2021)
14. • Speech

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    Bias-temperature phenomena in SOI structures and devices

    Nazarov, A.N. Barchuk, I.P. Kilchytska, Valeriya[UCL] (1998) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
15. • Speech

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    Modeling and measurements of high-temperature off-state currents in SOI MOSFETs

    Rudenko, Tamara Rudenko, A. Kilchytska, Valeriya[UCL] (1997) 8th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — Paris (France)
16. • Speech

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    Charge carrier injection and trapping in the buried oxides of SOI structures

    Nazarov, Alexei Kilchytska, Valeriya[UCL] Barchuk, I.P. (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
17. • Speech

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    A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs

    Rudenko, Tamara Lysenko, V.S Kilchytska, Valeriya Rudenko, A.N. (1998) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
18. • Speech

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    Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) International Microwave Symposium - IMS 2022 — Denver, Colorado, USA
19. • Journal article

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    Effect of RF plasma treatment on moving and accumulation charge in SiO2 layers of Al-polySi-SiO2-Si structures

    Nazarov, Alexei Lysenko, V.S Mikhailov, S.N. Tkachenko, A.S. Pavluk, M.I. Molostov, A.N. Kilchytska, Valeriya[UCL] (1994) Mikroelectronika — Vol. 23, no.3, p. 39-46 (1994)
20. • Journal article

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    Effect of ionizing irradiation on electrical properties of buried multilayer dielectrics of SOI structures, obtained by ZMR technique

    Vovk, Ya.N. Barchuk, I.P. Kilchytska, Valeriya[UCL] Lysenko , V.S. Nazarov, Alexei Rudenko, Tamara (1996) Mikroelectronika — Vol. 25, no.5, p. 346-353 (1996)
21. • Journal article

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    New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures

    Ólafsson, Halldor Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2002) Materials Science Forum — Vol. 389-393, p. 1001-1004 (2002)
22. • Journal article

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    A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface

    Ólafsson, Halldór Örn Sveinbjörnsson, Einar Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I.P. Osiyuk, I.N. (2003) Materials Science Forum — Vol. 433-436, p. 547-550 (2003)
23. • Journal article

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    Electrical properties of ZMR SOI structures with multilayer buried dielectrics

    Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) Mikroelectronika — Vol. 23, no.6, p. 32-38 (1994)
24. • Speech

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    Properties of high-temperature off-state currents in SOI MOSFETs derived from the diffusion mechanism

    Rudenko, Tamara Lysenko, V. Kilchytska, Valeriya Rudenko, A. Colinge, Jean-Pierre[UCL] (1999) Third European Conference on High Temperature Electronics (HITEN 1999) — Berlin (Germany)
25. • Journal article

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    High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs

    Lysenko, V.S. Nazarov, Alexei Kilchytska, Valeriya[UCL] Rudenko, Tamara Limanov, A.B. Colinge, Jean-Pierre (1998) Semiconductor Physics, Quantum Electronics & Optoelectronics — Vol. 1, no. 1, p. 101-107 (28/10/1998)

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