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    • Journal article
    Analysis of interface properties in MOS transistors by means of `charge pumping' measurements
    Declercq, Michel[UCL] Jespers, Paul[UCL] (1974) Acta Technica Belgica. Revue H F: Electricite Courants Faibles. Electronique Telecommunications — Vol. 9, no. 8, p. 244-253 (1974)