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Displaying 11 results.
    • Journal article
    The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs
    Emam, Mostafa[UCL] Houri, Samer[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2009) Journal of Telecommunications and Information Technology — no. 4, p. 18-24 (2009)
    • Journal article
    Partially Depleted SOI Versus Deep N-Well Protected Bulk-Si MOSFETs: A High-Temperature RF Study for Low-Voltage Low-Power Applications
    Emam, Mostafa[UCL] Raskin, Jean-Pierre[UCL] (2013) IEEE Transactions on Microwave Theory and Techniques — Vol. 61, no.4, p. 1496-1504 (Avril 2013)
    • Journal article
    Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?
    Emam, Mostafa[UCL] Sakalas, Paulius Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, Tao Chuan Danneville, Francois (2010) IEEE Transactions on Electron Devices — Vol. 57, no. 5, p. 1188-1191 (2010)