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Displaying 7 results.
    • Journal article
    Hall effect measurements in double-gate SOI MOSFETs
    Vandooren, Anne Flandre, Denis[UCL] Cristoloveanu, Sorin Colinge, Jean-Pierre[UCL] (2001) Solid-State Electronics — Vol. 45, no. 10, p. 1793-1798 (2001)
    • Speech
    Edge effects characterization in gate-all-around SOI MOSFETs
    Vandooren, Anne[UCL] Flandre, Denis[UCL] Cristoloveanu, Sorin Colinge, Jean-Pierre[UCL] (1998) IEEE International SOI Conference 1998 — Stuart (USA)
    • Speech
    Performance of double-gate SOI NMOSFETs at low temperature
    Vandooren, Anne[UCL] Cristoloveanu, Sorin Colinge, Jean-Pierre[UCL] Flandre, Denis[UCL] (2001) 2001 Electrochemical Society Conference — Washington DC (USA)
    • Speech
    Recombination current and carrier lifetime extraction in dual-gate fully depleted SOI devices
    Ernst, Thomas Cristoloveanu, Sorin Vandooren, Anne[UCL] Colinge, Jean-Pierre[UCL] Flandre, Denis[UCL] (1998) 28th European Solid-State Research Conference (ESSDERC 1998) — Bordeaux (France)
    • Journal article
    Improvement of SOI MOS current-mirror performances using serial-parallel association of transistors
    Deceuster, D.[UCL] Flandre, Denis[UCL] Colinge, Jean-Pierre[UCL] Cristoloveanu, Sorin (1996) Electronics Letters — Vol. 32, no. 4, p. 278-279 (1996)
    • Speech
    Comparison of hot-carrier effects in thin-film accumulation-mode SOI and GAA p-MOSFETs
    Flandre, Denis[UCL] Francis, P.[UCL] Colinge, Jean-Pierre[UCL] Cristoloveanu, Sorin (1993) IEEE International SOI Conference, 1993 — Palm Springs (USA)
    • Journal article
    Determination of film and surface recombination in thin-film SOI devices using gated-diode technique
    Rudenko, Tamara Flandre, Denis[UCL] Rudenko, A Kilchytska, Valeriya Cristoloveanu, Sorin Ernst, T. Colinge, Jean-Pierre Dessard, Vincent[UCL] (2004) Solid-State Electronics — Vol. 48, no. 3, p. 389-399 (2004)