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Displaying 16 results.
    • Journal article
    TOF-SIMS study of organosilane adsorption on model hydroxyl terminated surfaces
    Houssiau, L. Bertrand, Patrick[UCL] (2003) Applied Surface Science — Vol. 203, p. 580-585 (2003)
    • Journal article
    Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
    Heile, A. Lipinsky, D. Wehbe, Nimer[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Felten, Alexandre[FUNDP] Houssiau, L.[FUNDP] Pireaux, Jean-Jacques[FUNDP] De Mondt, R. Van Royen, P. Van Vaeck, L. Arlinghaus, H. F. (2008) Surface and Interface Analysis — Vol. 40, no. 3-4, p. 538-542 (2008)
    • Journal article
    Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.
    Delcorte, Arnaud[UCL] Yunus, Sami[UCL] Wehbe, Nimer[UCL] Nieuwjaer, Nicolas[UCL] Poleunis, Claude[UCL] Felten, Alexandre[FUNDP] Houssiau, L.[FUNDP] Pireaux, Jean-Jacques[FUNDP] Bertrand, Patrick[UCL] (2007) Analytical Chemistry — Vol. 79, no. 10, p. 3673-3689 (2007)
    • Journal article
    Direct observation of the rippling and the order-disorder transition at the Cu3Au(100) surface by TOF-ion scattering
    Houssiau, L. Bertrand, Patrick[UCL] (1996) Surface Science — Vol. 352, p. 978-982 (1996)
    • Journal article
    MARLOWE simulations of He and Ne ion scattering on Cu/sub 3/Au(100) and comparison with TOF-ISS experiments
    Houssiau, L. Bertrand, Patrick[UCL] (1997) — (null)
    • Journal article
    Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams
    Mouhib, T. Poleunis, Claude[UCL] Wehbe, N.[FUNDP] Michels, J. J. Galagan, Y. Houssiau, L.[FUNDP] Bertrand, Patrick[UCL] Delcorte, Arnaud[UCL] (2013) The Analyst — Vol. 138, no.22, p. 6801-6810 (2013)
    • Journal article
    Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers
    Wehbe, N.[FUNDP] Mouhib, Taoufiq[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Moellers, R. Niehuis, E. Houssiau, L.[FUNDP] (2014) Analytical and Bioanalytical Chemistry — Vol. 406, p. 201-211 (2014)
    • Journal article
    ToF-SIMS study of organosilane self-assembly on aluminum surfaces
    Houssiau, L. Bertrand, Patrick[UCL] (2001) Applied Surface Science — Vol. 175, p. 351-356 (2001)
    • Journal article
    Observation of surface rippling on Cu/sub 3/Au(100) with ToF-ISS
    Houssiau, L. Bertrand, Patrick[UCL] (1996) —
    • Journal article
    A round robin experiment of elemental sensitivity factors in low-energy ion scattering
    Brongersma, HH Carrere-Fontaine, H Cortenraad, R van der Gon, AWD Scanlon, PJ Spolveri, I Cortigiani, B Bardi, U Taglauer, E Reiter, S Labich, S Bertrand, Patrick[UCL] Houssiau, L. Speller, S Parascandola, S Unlu-Lachnitt, H Heiland, W (1998) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 142, no. 3, p. 377-386 (1998)
    • Journal article
    Surface-structure Analysis By Time-of-flight Iss - Influence of Primary Ion Nature and Energy for Scattering On Cu(110)
    Houssiau, L. Bertrand, Patrick[UCL] (1994) Vacuum : surface engineering, surface instrumentation & vacuum technology — Vol. 45, no. 4, p. 409-412 (1994)
    • Journal article
    Order-disorder phase transition of the Cu3Au(100) surface studied by ToF-ion scattering
    Houssiau, L. Bertrand, Patrick[UCL] (1996) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 118, no. 1-4, p. 467-472 (1996)
    • Journal article
    Observation of surface rippling on Cu3Au(100) with ToF-ISS
    Houssiau, L. Bertrand, Patrick[UCL] (2004) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 115, no. 1-4, p. 161-164 (2004)
    • Journal article
    Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
    Heile, A. Lipinsky, D. Wehbe, Nimer[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Felten, Alexandre[FUNDP] Houssiau, L.[FUNDP] Pireaux, Jean-Jacques[FUNDP] De Mondt, R. Van Vaeck, L. Arlinghaus, H. F. (2008) Applied Surface Science — Vol. 255, no. 4, p. 941-943 (2008)
    • Journal article
    TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn
    Wehbe, N.[FUNDP] Tabarrant, T.[FUNDP] Brison, J.[FUNDP] Mouhib, Taoufiq[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Moellers, R. Niehuis, E. Houssiau, L.[UCL] (2013) Surface and Interface Analysis — Vol. 45, no. 1, p. 178-180 (2013)
    • Journal article
    TOF-SIMS study of alkanethiol adsorption and ordering on gold
    Houssiau, L. Bertrand, Patrick[UCL] (2001) Applied Surface Science — Vol. 175, p. 399-406 (2001)