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    Application of ToF-SIMS to the surface characterization of catalysts
    Bertrand, Patrick[UCL] Poleunis, Claude[UCL] Weng, Lu Tao[UCL] Devillers, Michel[UCL] De Smet, Frédéric[UCL] Tirions, Olivier[UCL] Lalande, G. Guay, D. Dodelet, J.P. (1999) The Physical Electronics Seminar on "ToF-SIMS characterization of catalysts and inorganic compounds" — Baarn, The Netherlands