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Displaying 12 results.
    • Journal article
    Comparison of Contact Resistance Between Accumulation-Mode and Inversion-Mode Multigate FETs
    Lee, Chi-Woo Lederer, Dimitri[UCL] Afzalian, Aryan[UCL] Yan, Ran Dehdashti, Nima Xiong, Weize Colinge, Jean-Pierre (2008) Solid-State Electronics — Vol. 52, no.11, p. 1815-1820 (November 2008)
    • Journal article
    Properties of Accumulation-Mode Multi-Gate Field-Effect Transistors
    Colinge, Jean-Pierre Lederer, Dimitri Afzalian, Aryan[UCL] Yan, Ran Lee, Chi-Woo Dehdashti Akhavan, Nima Xiong, Weize (2009) Japanese Journal of Applied Physics — Vol. 48, p. 034502 (7 pages) (March 2009)
    • Speech
    3D simulation and measurement of very narrow AM and IM triple-gate MOSFETs
    Yan, Ran Afzalian, Aryan[UCL] Lee, Chi-Woo Dehdashti Akhavan, Nima Xiong, Weize Colinge, Jean-Pierre (2008) 2008 China-Ireland International Conference on Information and Communication Technologies (CIICT 2008) — Beijing (China)
    • Speech
    Influence of gate underlap in AM and IM MuGFETs
    Lee, Chi-Woo Afzalian, Aryan[UCL] Dehdashti, Nima Xiong, Weize Colinge, Jean-Pierre (2008) ESSDERC-ESSCIRC 2008 — Edinburgh (UK)
    • Speech
    Hot carrier (HC) and Bias-Temperature-Instability (BTI) degradation of MuGFETs on silicon oxide and silicon nitride buried layers
    Lee, Chi-Woo Ferain, Isabelle Afzalian, Aryan[UCL] Byun, K.-Y. Yan, Ran Dehdashti, Nima Razavi, P. Xiong, Weize Colinge, Jean-Pierre Colinge, C.A. Ioannou, D.E. (2009) ESSDERC 2009 —
    • Speech
    Influence of Fluorine Implant on Threshold Voltage for Metal Gate FDSOI and MuGFET
    Xiong, Weize Hsu, C.H. Cleavelin, C.R. Ma, M. Patruno, P. Lee, Chi-Woo Yan, Ran Lederer, Dimitri Afzalian, Aryan[UCL] Colinge, Jean-Pierre (2007) 2007 IEEE International SOI Conference — Indian Wells (USA)
    • Journal article
    Drain breakdown Voltage in MuGFETs: Influence of Physical Parameters
    Lee, Chi-Woo Afzalian, Aryan[UCL] Yan, Ran Dehdasti Akhavan, Nima Xiong, Weize Colinge, Jean-Pierre (2008) IEEE Transactions on Electron Devices — Vol. 55, no.12, p. 3503-3506 (November 2008)
    • Journal article
    Influence of gate misalignment on the electrical characteristics of MuGFETs
    Lee, Chi-Woo Afzalian, Aryan[UCL] Ferain, Isabelle Yan, Ran Dehdashti Akhavan, Nima Xiong, Weize Colinge, Jean-Pierre (2010) Solid-State Electronics — Vol. 54, no.3, p. 226-230 (8/09/2009)
    • Speech
    Influence of Gate Misalignment on the Electrical Characteristics of MuGFETs
    Lee, Chi-Woo Afzalian, Aryan[UCL] Dehdashti, Nima Xiong, Weize Colinge, Jean-Pierre (2009) International Symposium on VLSI Technology – Systems and applications (VLSI-TSA) — Hsinchu (Taiwan)
    • Speech
    Ultra-scaled Z-RAM cell
    Okhonin, S. Nagoga, M. Lee, Chi-Woo Colinge, Jean-Pierre Afzalian, Aryan[UCL] Yan, Ran Dehdashti Akhavan, Nima Xiong, Weize Sverdlov, V. Selberherr, S. Mazure, C. (2008) 2008 IEEE International SOI Conference — New paltz, NY (USA)
    • Speech
    MultiGate SOI MOSFETs: Accumulation-Mode vs. Enhancement-Mode
    Afzalian, Aryan[UCL] Lederer, Dimitri Lee, Chi-Woo Yan, Ran Xiong, Weize Cleavelin, C. Rinn Colinge, Jean-Pierre (2008) IEEE 2008 Silicon Nanoelectronics Workshop — Honolulu (USA)
    • Journal article
    Comparison of different surface orientation in narrow fin MuGFETs
    Lee, Chi-Woo Afzalian, Aryan[UCL] Ferain, Isabelle Yan, Ran Dehdashti, Nima Byun, Ki-Yeol Colinge, Cynthia Xiong, Weize Colinge, Jean-Pierre (2009) Microelectronic Engineering — Vol. 86, p. 2381-2384 (April 2009)